High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing
AssigneeJohnstech International Corporation
InventorsJeffrey Sherry, Michael Andres
Life of this patent
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Abstract
A test socket (14) for a testing an integrated circuit (12) with controlled impedance while maintaining the structural integrity of the test pins (20). The pin (20) can have a sidewall with a thick portion 32 and a thinner portion (30) along the length of the pin. The pin can have projections (42) which provide a standoff from the slot (40). The sidewalls themselves can have projections or lands (60, 61) which extend into the slot and provide stability for the pin (20).
Claims23
An apparatus for electrically connecting a lead of an integrated circuit (12) device to be tested to a corresponding terminal of a load board (24) at a test site, comprising:
- a. a housing (14) having upper and lower surfaces, a first surface approachable by an integrated circuit device under test (12) to be tested and a second surface proximate the load board;
- b. a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said sidewall;
- c. a contact pin (20) having first and second sidewalls and being slideably receivable in said slot (40), said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
- d. a first projection (61, 60, 47, 42, 43, 34) filling a portion of said gap adjacent said first inner wall and a second projection filling a portion of said gap adjacent said second inner wall;
- said projections providing longitudinal stability for said pin as it is engaged by the device under test and allowing air to provide a dielectric around said projections in said gap.
An apparatus for electrically connecting a lead of an integrated circuit (12) device to be tested to a corresponding terminal of a load board (24) at a test site, comprising:
- a. a housing (14) having upper and lower surfaces, a first surface approachable by an integrated circuit device under test (12) to be tested and a second surface proximate the load board;
- b. a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said sidewall;
- c. a contact pin (20) having first and second sidewalls and being slideably receivable in said slot (40), said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
- d. a first projection (61, 60, 47, 43, 42, 34) filling a portion of said gap extending from said first inner wall and a second projection filling a portion of said gap extending from said second inner wall;
- said projections providing longitudinal stability for said pin as it is engaged by the device under test and allowing air to provide a dielectric around said projections in said gap.
An apparatus for electrically connecting a lead of an integrated circuit (12) device to be tested to a corresponding terminal of a load board (24) at a test site, comprising:
- a. a housing (14) having upper and lower surfaces, a first surface approachable by an integrated circuit device under test (12) to be tested and a second surface proximate the load board;
- b. a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said sidewall;
- c. a contact pin (20) having first and second sidewalls and being slideably receivable in said slot (40), said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
- d. a first projection (61, 60, 47, 43, 42, 34) filling a portion of said gap extending from said first and second pin sidewalls and filling a portion of said gap extending from said second inner wall;
- said projections providing longitudinal stability for said pin as it is engaged by the device under test and allowing air to provide a dielectric around said projections in said gap.
A method of making an improved impedance integrated circuit test contactor for testing a device under test, the housing having upper and lower surfaces, a first surface approachable by an integrated circuit device under test (12) to be tested and a second surface proximate the load board;
- a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said sidewall;
- a contact pin having first and second sidewalls and being slideably receivable in said slot, said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
- comprising:
- forming a first projection filling a portion of said gap adjacent said first inner wall and a second projection filling a portion of said gap adjacent said second inner wall;
- allowing air to fill spaces around said projections to provide a dielectric around said projections in said gap.
Dependencies are inferred from the claim text.