Silicon carbide semiconductor device
AssigneeMitsubishi Electric Corporation
InventorsTakaaki TOMINAGA, Yasushi TAKAKI, Yoichiro TARUI, Shiro HINO
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorsTakaaki TOMINAGA, Yasushi TAKAKI, Yoichiro TARUI, Shiro HINO
Estimating the term…
A silicon carbide semiconductor device includes a silicon carbide semiconductor substrate having an n-type drift layer, and a p-type well region formed in a surface portion of a part of the drift layer, an insulating film provided on the well region, a gate built-in resistor formed of polysilicon in contact with a surface of the insulating film, an interlayer insulating film formed on the gate built-in resistor, a gate contact wire that is connected to a gate pad and formed on the interlayer insulating film, a gate wire provided on the interlayer insulating layer so as to be apart from the gate contact wire, a first gate contact for electrically connecting the gate contact wire and the gate built-in resistor, and a second gate contact for electrically connecting the gate wire and the gate built-in resistor.
A silicon carbide semiconductor device comprising:
A silicon carbide semiconductor device comprising:
Dependencies are inferred from the claim text.