Memory device and control method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorMIN-SANG PARK
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Abstract
A method of controlling a memory device including a temperature sensor includes sensing a temperature of the memory device and extracting an extracted temperature for controlling the memory device using the sensed temperature, storing the extracted temperature in the memory device, calculating an estimated temperature at a current time point using the extracted temperature and a plurality of past extracted temperatures stored in the memory device, and controlling the memory device using the estimated temperature.
Claims20
A method of controlling a memory device comprising a temperature sensor, the method comprising:
- sensing a temperature of the memory device, and extracting an extracted temperature for controlling the memory device using the sensed temperature;
- storing the extracted temperature in the memory device;
- calculating an estimated temperature at a current time point using the extracted temperature and a plurality of past extracted temperatures stored in the memory device;
- and
- controlling the memory device using the estimated temperature.
A memory device, comprising:
- at least one memory cell array;
- a temperature sensor configured to sense a temperature of the memory device;
- a control logic circuit configured to receive the sensed temperature from the temperature sensor, generate an extracted temperature of the memory device using the sensed temperature, generate a calibrated temperature using the extracted temperature and a plurality of past extracted temperatures, and control operations of the at least one memory cell array using the calibrated temperature;
- and
- a register configured to store the extracted temperature and the plurality of past extracted temperatures and provide the plurality of past extracted temperatures stored in the temperature register to the control logic circuit.
A method of determining a temperature of a memory device, the method comprising:
- sensing, by at least one temperature sensor, a temperature of the memory device;
- extracting the temperature of the memory device using the sensed temperature;
- generating an estimated temperature at a current time point using the extracted temperature and a plurality of past extracted temperatures stored in the memory device;
- and
- determining a calibrated temperature of the memory device using the estimated temperature and the extracted temperature,
- wherein when the extracted temperature and the estimated temperature over a period of time are plotted in a graph as a plurality of extracted temperatures and a plurality of estimated temperatures, the plurality of extracted temperatures represent a curve that is substantially parallel and shifted in a positive time direction by an extraction delay time on a time axis with respect to a plurality of real temperatures of the memory device, and the plurality of estimated temperatures represent a curve that is closer to the plurality of real temperatures than the plurality of extracted temperatures.
Dependencies are inferred from the claim text.