System and methods for extracting correlation curves for an organic light emitting device

A method of determining the efficiency degradation of organic light emitting devices (OLEDs) and compensating for said deficiency an array-based semiconductor display device having an array of pixels that include OLEDs, the array-based semiconductor display device further comprising a controller and a readout circuit, said method comprising:

• storing a library of interdependency curves in a memory of the array-based semiconductor display device, said interdependency curves directly relating changes in an electrical operating parameter for one or more reference OLED pixels to the efficiency degradation of said one or more reference OLED pixels for a plurality of stress conditions;
• using the controller to:
• a) control the readout circuit to periodically measure the electrical operating parameter for at least one OLED in at least one of the pixels of the array-based semiconductor display device, determine changes in said electrical operating parameter from a baseline value, and store the changes in the memory;
• b) determine a stress condition of the at least one OLED using a calculated rate of change of the electrical operating parameter for the at least one OLED with use of said stored changes in said electrical operating parameter;
• c) determine the efficiency degradation of the at least one OLED based on at least one interdependency curve selected from the library with use of the determined stress condition, and
• d) modify a programming voltage or current for the at least one of the pixels to compensate for said efficiency degradation.