Regulator control during scan shift and capture cycles
AssigneeSilicon Laboratories Inc.
InventorVivek Sarda
Life of this patent
Estimating the term…
Abstract
During scan testing a voltage regulator is programmed to supply a first voltage to logic under test during a shift portion of the scan test, a second voltage during a first portion of a capture portion of the scan test and at least a third voltage during a second portion of the capture portion of the scan test. The availability of a programmable voltage regulator during shift and capture portions of scan testing allows a less stressful voltage to be used during a shift portion of the scan test to reduce shift failures and allows various voltages to be used during capture portions of the scan testing as a surrogate for testing at different temperatures and to provide more flexibility in testing margins.
Claims20
An integrated circuit comprising:
- a first voltage regulator;
- a plurality of storage elements configurable into one or more scan chains;
- a first control circuit configured to supply the first voltage regulator a first value of a regulator control signal to cause the first voltage regulator to supply as a supply voltage a first voltage to the plurality of storage elements during a shift portion of a scan test;
- and
- wherein the first control circuit is configured to supply the first voltage regulator a second value of the regulator control signal to cause the first voltage regulator to supply as the supply voltage to the plurality of storage elements a second voltage during a first portion of a capture portion of the scan test and the first control circuit is configured to supply the first voltage regulator a third value of the regulator control signal to cause the first voltage regulator to supply as the supply voltage a third voltage during a second portion of the capture portion of the scan test.
A method comprising:
- configuring a plurality of storage elements into one or more scan chains;
- supplying the storage elements a first voltage from a voltage regulator as a supply voltage during a shift portion of a scan test;
- and
- supplying the storage elements a second voltage from the voltage regulator as the supply voltage during a first portion of a capture portion of the scan test with the storage elements configured in a functional mode.
A method comprising:
- running a first capture portion of a first scan test of an integrated circuit with a supply voltage from a voltage regulator on the integrated circuit supplying a first voltage that has been correlated to a first temperature;
- and
- running a second capture portion of a second scan test with the supply voltage from the voltage regulator at a second voltage that has been correlated to a second temperature.
Dependencies are inferred from the claim text.