Voltage regulator bypass circuitry usable during device testing operations

A method of testing an integrated circuit, the method comprising:

• selectively bypassing a low voltage regulator and a medium voltage regulator by:
• forcing an external voltage regulator select signal to a second logic value using a test tool;
• forcing a low voltage regulator bypass signal to a first logic value using a test tool;
• and
• applying an external voltage that is wider in range than a voltage range producible by a medium voltage regulator to an external voltage pad to power circuitry coupled to the medium voltage regulator, and testing the circuitry, if the first logic value is a logic high and the second logic value is a logic low.

A circuit, comprising:

• a first voltage regulator having a power down terminal and an output coupled to first circuitry;
• a second voltage regulator having a power down terminal and an output coupled to second circuitry;
• a first voltage regulator bypass circuit having an input terminal and an output terminal;
• an OR gate having inputs coupled to an external regulator select terminal and the output terminal of the first voltage regulator bypass circuit, and an output coupled to the power down terminal of the first voltage regulator;
• an inverter having an input coupled to the external regulator select terminal;
• an AND gate having inputs coupled to the output of the inverter and the output terminal of the first voltage regulator bypass circuit, and an output coupled to the power down terminal of the second voltage regulator.