Optical fiber strain measurement apparatus and optical fiber strain measurement method
AssigneeOki Electric Industry Co., Ltd.
InventorHideyuki IWAMURA
Life of this patent
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AssigneeOki Electric Industry Co., Ltd.
InventorHideyuki IWAMURA
Estimating the term…
Object is to enable a directly-modulated semiconductor laser to be applied as a light source of probe light. A transmission unit configured to generate probe light; and a reception unit including a receiver-side optical bandpass filter that extracts a Stokes component of Brillouin backscattered light from backscattered light which is caused by the probe light in a measurement target optical fiber, and a self-delayed heterodyne interferometer that detects a change in a frequency shift amount of the Stokes component as a phase difference are included. The transmission unit includes a directly-modulated light source configured to generate an optical pulse, and a transmitter-side optical bandpass filter provided in a stage following the directly-modulated light source, and configured to transmit wavelength of an ON level of the optical pulse as the probe light, and block wavelength of an OFF level.
An optical fiber strain measurement apparatus comprising:
An optical fiber strain measurement method comprising:
Dependencies are inferred from the claim text.