Method of reconditioning an electronic processing device

Abstract

The invention provides a method of assessing suitability of a component for assembly in an electronic processing device. A first step of the method comprises obtaining a component of an electronic processing device. This may be obtained from a disassembled electronic processing device. The method includes subjecting said component to a plurality of tests where at least two of said tests are of a different technical character to each other and assessing test data derived from each of said plurality of tests to determine to a selected or calculated degree of confidence whether or not the tested component is to be considered as a suitable component for assembly in an electronic processing device of a type to which the tested component belongs. The test data may be automatically assessed by a data processing system.

Dependencies are inferred from the claim text.