Localized Sensor Quality Analysis and Control
AssigneeInternational Business Machines Corporation
InventorsEric J. Barkie, Benjamin Fletcher, Timothy P. Roche, Shawn Stedman
Life of this patent
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AssigneeInternational Business Machines Corporation
InventorsEric J. Barkie, Benjamin Fletcher, Timothy P. Roche, Shawn Stedman
Estimating the term…
An apparatus includes a memory comprising executable instructions and a processor coupled to the memory and configured to execute the instructions. Executing the instructions causes the processor to receive a broadcast including measurement data captured by a first sensor, verify integrity of the measurement data, perform a quality control analysis on the measurement data by analyzing the measurement data using a quality control algorithm to form an analysis result, generate a response for broadcasting the analysis result, and broadcast the analysis result. The response comprises a determination of pass when the quality control analysis indicates that the measurement data passes the quality control analysis and a determination of fail, a suspected cause of the failure, and a recommended resolution for the suspected cause of the failure when the quality control analysis indicates that the measurement data fails the quality control analysis.
An apparatus comprising:
-16. (canceled)
A computer program product for localized sensor quality analysis and control, the computer program product comprising a computer readable storage medium having program instructions embodied therewith, the program instructions executable by a processor to cause the processor to:
Dependencies are inferred from the claim text.