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US 2019/0058048 A1Published application
Ohmic electrode
AssigneeKabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
InventorsHiroshi GOTO, Hisatoshi SAKAMOTO
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Abstract
An ohmic electrode that is used in, for example, a power semiconductor device including: a SiC substrate including an ohmic contact layer formed on a SiC semiconductor layer and formed of a material selected from the group consisting of nickel and nickel silicide, a barrier layer formed on the ohmic contact layer, and an electrode layer formed on the barrier layer and formed of a copper alloy containing at least one from among zinc, nickel, titanium, manganese, and calcium.
Claims7
1-6. (canceled)
7:
- An ohmic electrode, comprising:
- an ohmic contact layer formed on a SiC semiconductor layer, the ohmic contact layer comprising a material selected from the group consisting of nickel and nickel silicide;
- a barrier layer formed on the ohmic contact layer;
- and
- an electrode layer formed on the barrier layer, the electrode layer comprising a copper alloy comprising at least one selected from the group consisting of zinc, nickel, titanium, manganese, and calcium,
- wherein the barrier layer comprises an element that forms no solid solution with copper or an element that forms a compound with copper, and
- wherein the barrier layer comprises a material selected from the group consisting of molybdenum, tantalum, tungsten, niobium, titanium, and a nitride thereof.
4 more elements
8:
- The ohmic electrode according to claim 7,
- wherein the copper alloy comprises at least one selected from the group consisting of
- zinc in an amount of 0.1 at % or more and 3 at % or less;
- nickel in an amount of 0.1 at % or more and 3 at % or less;
- titanium in an amount of 0.1 at % or more and 0.5 at % or less;
- manganese in an amount of 0.1 at % or more and 1 at % or less, and
- calcium in an amount of 0.1 at % or more and 1 at % or less.
4 more elements
9:
- The ohmic electrode according to claim 7, wherein the barrier layer has a film thickness of 10 nm or more and 100 nm or less.
10:
- A SiC semiconductor device, comprising the ohmic electrode according to claim 7.
11:
- A SiC semiconductor device, comprising the ohmic electrode according to claim 8.
12:
- A SiC semiconductor device, comprising the ohmic electrode according to claim 9.