Enlarging Spacer Thickness by Forming a Dielectric Layer Over a Recessed Interlayer Dielectric
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-Han Lin, Che-Cheng Chang, Horng-Huei Tseng
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-Han Lin, Che-Cheng Chang, Horng-Huei Tseng
Estimating the term…
An exemplary semiconductor device includes first spacers disposed along sidewalls of a first gate structure and second spacers disposed along sidewalls of a second gate structure. A source/drain region is disposed between the first gate structure and the second gate structure. A first ILD layer is disposed between the first spacers and the second spacers. A portion of the first ILD layer has a first recessed upper surface. A dielectric layer is disposed over the first spacers, the second spacers, and the first recessed upper surface of the first ILD layer. A portion of the dielectric layer has a second recessed upper surface that is disposed over the portion of the first ILD layer having the first recessed upper surface. A second ILD layer is disposed over the dielectric layer. A contact extends through the second ILD layer, the dielectric layer, and the first ILD layer to the source/drain region.
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
The semiconductor device 13, wherein the dielectric layer is further disposed over the first gate structure and the second gate structure.
The semiconductor device 13, wherein a material of the dielectric layer is different than a material of the first interlevel dielectric layer and a material of the second interlevel dielectric layer.
Dependencies are inferred from the claim text.