US 2019/0056580 A1 · HIGH-RESOLUTION SCANNING MICROSCOPY RESOLVING AT LEAST TWO SPECTRAL RANGES

Abstract

For the purposes of high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescent radiation in such a way that the illumination radiation is focused at a point in or on the sample, so as to form a diffraction-limited illumination spot. The point is imaged in a diffraction image on a detector in a diffraction-limited manner, wherein the detector has detector elements and a plurality of location channels which resolve a diffraction structure of the diffraction image. The sample is scanned with various scanning positions with an increment smaller than half the diameter of the illumination spot. An image of the sample with a resolution that is increased beyond a resolution limit of the image is generated from the data of the detector and from the scanning positions associated with these data. In order to distinguish between at least two predetermined spectral channels in the fluorescent radiation of the sample, for each location channel there is an independent beam path leading to a separating element that spectrally divides these beam paths into the spectral channels and then remixes the spectral channels of the different location channels into the same number, on additional independent beam paths, such that a plurality of the additional independent beam paths receive the radiation in different spectral channels and from different location channels, and each of these additional independent beam paths leads to one of the detector elements.

Claims12

Dependent claims

A method for high-resolution scanning microscopy of a sample, said method comprising

exciting the sample by illumination radiation to emit fluorescence radiation wherein the illumination radiation is focused to a point in or on the sample to form a diffraction-limited illumination spot,
imaging the point in diffraction-limited manner to a diffraction image on a detection area of a spatially resolving detector device, wherein:
the detection area has spatial channels defining a spatial resolution of the detector device, which resolution resolves a diffraction structure of the diffraction image;
the detector device comprises detector elements for detecting radiation of the diffraction image;
for each of the plurality of the spatial channels, the radiation guided thereto is spectrally divided into multiple spectral channels;
the thus obtained channels are merged to form mixed channels receiving radiation originating from different spatial channels and radiation from various spectral channels;
and
each mixed channel is guided to one of the detector elements,
displacing the point relative to the sample into different scanning positions with an increment of less than half the diameter of the illumination spot,
reading intensity data from the detector elements for each scanning position and producing an image of the sample from the intensity data and the scanning positions assigned thereto, said image having a resolution increased beyond a resolution limit for imaging the point, wherein the spectral channels and spatial channels of the radiation are taken into account for each detector element and a multi-spectral image of the sample is produced.

7 more elements

A microscope for high-resolution scanning microscopy, the microscope comprising

a sample space for receiving a sample which is excitable to emit fluorescent radiation,
an optical unit which has a focal plane, located in the sample space, and a resolution limit,
an illumination device, which has an entrance for receiving illumination radiation and illuminates, the sample space with the illumination radiation via the optical unit in such a way that the optical unit focuses the illumination radiation to a point in the focal plane to form a diffraction-limited illumination spot,
an imaging device for diffraction-limited imaging of the point in the focal plane to a diffraction image by the optical unit,
a spatially resolving detector device having a detection area lying in a plane that is conjugate to the focal plane, wherein
the detection area comprises spatial channels defining a spatial resolution of the detector device, which resolution resolves a diffraction structure of the diffraction image,
the detector device comprises detector elements for detecting radiation of the diffraction image,
the detector device comprises a splitting and mixing device which, for each of the plurality of the spatial channels, spectrally divides the radiation guided thereto into multiple spectral channels G) and which merges these together again to form mixed channels, wherein the splitting and mixing device merges radiation originating from different spatial channels into each mixed channel and radiation from various spectral channels into the plurality of mixed channels and guides each mixed channel to one of the detector elements,
a scanning device for displacing the point into different scanning positions with an increment of less than half the diameter of the illumination spot,
an evaluation device for reading intensity data from the detector elements and the scanning positions assigned thereto, and for producing an image of the sample from the intensity data and the scanning positions assigned thereto, said image having a resolution increased beyond the resolution limit of the optical unit, wherein the evaluation device takes into account the spectral channels and spatial channels of the radiation supplied thereto for each detector element and produces a multi-spectral image of the sample.

7 more elements

Dependencies are inferred from the claim text.

High-resolution scanning microscopy resolving at least two spectral ranges

Life of this patent

High-resolution scanning microscopy resolving at least two spectral ranges

Life of this patent

Abstract

Claims12