Vector network analyzer with digital interface
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsSteffen HEUEL, Steffen NEIDHARDT, Thilo BEDNORZ
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Abstract
A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.
Claims15
A vector network analyzer, comprising:
- a first measuring port;
- a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test;
- a second measuring port adapted to be connected to a radio frequency input or output of the device under test;
- and
- a processor adapted to determine scattering (S)-parameters of the device under test, based on measuring signals transmitted to the device under test and received from the device under test by the first measuring port and the second measuring port.
A method for measuring scattering parameters (S-parameters) of a device under test, comprising:
- connecting a device under test to a digital interface of a vector network analyzer;
- connecting the device under test to a measuring port of the vector network analyzer;
- supplying a digital measuring signal, generated from a first analog measuring signal to the device under test, by the digital interface;
- measuring an analog measuring signal generated by the device under test as reaction to the digital measuring signal, by the measuring port of the vector network analyzer;
- and
- determining the S-parameters of the device under test from the first analog measuring signal and the second analog measuring signal.
A method for measuring scattering parameters (S-parameters) of a device under test, comprising:
- connecting a device under test to a digital interface of a vector network analyzer;
- connecting the device under test to a measuring port of the vector network analyzer;
- supplying a first analog measuring signal to the device under test by the measuring port;
- receiving a digital measuring signal by the first digital interface and generating a second analog measuring signal therefrom;
- measuring the second analog measuring signal by the first measuring port;
- and
- determining the S-parameters of the device under test from the second analog measuring signal and the first analog measuring signal.
A method for measuring scattering parameters (S-parameters) of a device under test, comprising:
- connecting a device under test to a first digital interface of a vector network analyzer;
- connecting the device under test to a second digital interface of the vector network analyzer;
- connecting the device under test to a first measuring port of the vector network analyzer;
- connecting the device under test to a second measuring port of the vector network analyzer;
- generating a first analog Inphase-parameter signal by a third measuring port;
- providing a digital I-parameter signal, generated from the analog I-parameter signal to the device under test by the first digital interface;
- generating an analog quadrature phase parameter signal by a fourth measuring port, providing a digital Q-parameter signal generated from the analog Q-parameter signal to the device under test by the second digital interface;
- providing a local oscillator signal to the device under test by the fourth measuring port;
- measuring an analog measuring signal by the second measuring port;
- and
- determining scattering parameters of the device under test from the analog measuring signal, the local oscillator signal, the analog I-parameter signal and the first analog Q-parameter signal.
A method for measuring scattering parameters (S-parameters) of a device under test, comprising:
- connecting a device under test to a first digital interface of a vector network analyzer;
- connecting the device under test to a second digital interface of the vector network analyzer;
- connecting the device under test to a first measuring port of the vector network analyzer;
- connecting the device under test to a second measuring port of the vector network analyzer;
- providing a local oscillator signal to the device under test, by the second measuring port;
- providing an analog measuring signal to the device under test, by the first measuring port;
- receiving a digital Inphase (I) parameter signal and determining an analog Inphase (I) parameter signal therefrom;
- receiving a digital Quadrature phase (Q) parameter signal and determining an analog Q parameter signal therefrom;
- and
- determining the scattering (S) parameters of the device under test from the analog Inphase (I) parameter signal, the analog quadrature phase (Q) parameter signal, the local oscillator signal and the analog measuring signal.
Dependencies are inferred from the claim text.