Equipment process monitoring system with automatic configuration of control limits and alert zones
AssigneeIntel Corporation
InventorsPetek YONTAY, Rita CHATTOPADHYAY
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AssigneeIntel Corporation
InventorsPetek YONTAY, Rita CHATTOPADHYAY
Estimating the term…
Apparatuses, methods and storage medium associated with monitoring or assisting in monitoring of an equipment process are disclosed herein. In embodiments, an apparatus may comprise an analyzer to: receive a plurality of simulation results of a plurality of control limit and alert zone combinations for potential use with a control chart to monitor the equipment process, and calculate a plurality of performance metrics for each of the plurality of control limit and alert zone combinations, using the plurality of simulation results. The apparatus may further select an optimal combination of control limits and alert zones, based at least in part on the plurality of performance metrics, and configure an equipment process monitor with the selected optimal combination of control limits and alert zones for use with a control chart to monitor the equipment process. Other embodiments may be described or claimed.
An apparatus for monitoring or assisting in monitoring an equipment process, comprising:
A method for monitoring or assisting in monitoring an equipment process, comprising:
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One or more computer-readable media comprising instructions that cause a computing device, in response to execution of the instructions by the computing device, to:
Dependencies are inferred from the claim text.