Spectrum measurement apparatus and spectrum measurement method
AssigneeSamsung Electronics Co., Ltd.
InventorSang Kyu KIM
Life of this patent
Estimating the term…
Abstract
A spectrum measurement apparatus includes: a plurality of light sources configured to emit light having different wavelengths to an object; a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light; and a processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and by applying the electric signal having the determined strength to the plurality of light sources to obtain a spectrum of the object.
Claims15
A spectrum measurement apparatus comprising:
- a plurality of light sources configured to emit light having different wavelengths to an object;
- a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light;
- and
- a processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and to obtain a spectrum of the object by applying the electric signal having the determined strength to the at least one of the plurality of light sources.
A spectrum measurement method of a spectrum measurement apparatus comprising a plurality of light sources and a light detector, the spectrum measurement method comprising:
- determining a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources;
- and
- obtaining a spectrum of an object by applying the electric signal having the determined strength to the at least one of the plurality of light sources.
A composition analysis apparatus comprising:
- a spectrum measurer configured to obtain a spectrum of an object;
- and
- a first processor configured to analyze the spectrum of the object to analyze a composition of the object,
- wherein the spectrum measurer comprises:
- a plurality of light sources configured to emit light having different wavelengths to the object;
- a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light;
- and
- a second processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and to obtain the spectrum of the object by applying the electric signal having the determined strength to the at least one of the plurality of light sources.
Dependencies are inferred from the claim text.