Manufacturing facility anomaly diagnostic device

A manufacturing facility anomaly diagnostic device, comprising:

• a feature value storage unit configured to hold information of a feature value that captures an operation state of a manufacturing facility;
• a data conversion unit configured to convert data that includes operation data of the manufacturing facility or measurement data of a measurement device provided in the manufacturing facility;
• a feature value analysis unit configured to analyze the data converted by the data conversion unit, based on the information of the feature value held by the feature value storage unit;
• a data restoration unit configured to restore the data, based on the information of the feature value held by the feature value storage unit and information of a result of the analysis by the feature value analysis unit;
• an anomaly degree calculation unit configured to calculate an anomaly degree, based on the data used in the analysis by the feature value analysis unit and the data restored by the data restoration unit;
• and
• an anomaly diagnostic unit configured to perform anomaly diagnosis, based on the anomaly degree calculated by the anomaly degree calculation unit.