High Input Impedance Electro-Optic Sensor
AssigneeTektronix, Inc.
InventorsMichael J. Mende, Richard A. Booman
Life of this patent
Estimating the term…
Abstract
The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.
Claims20
An electro-optical sensor comprising:
- a test signal input to receive a test signal from a device under test (DUT);
- a bias circuit to generate a bias signal;
- a Mach-Zehnder Modulator (MZM) including an optical input, an optical output, and a bias input, the MZM configured to:
- receive an optical carrier signal via the optical input;
- receive both the test signal and the bias signal on the bias input;
- modulate the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal;
- and
- output the optical signal over the optical output.
An electro-optical sensor comprising:
- a test signal input;
- a split path buffer including an Alternating Current (AC) path and a Direct Current (DC) path, the AC path and the DC path coupled to the test signal input;
- and
- a Mach-Zehnder Modulator (MZM) including a bias input coupled to the test signal input and a bias circuit via the split path buffer.
A method comprising:
- conducting a bias signal to a Mach-Zehnder Modulator (MZM) bias input to control an operating mode of the MZM;
- conducting a test signal from a test signal input to the MZM bias input via a split path buffer;
- and
- employing the test signal on the bias input to modulate an optical carrier to create an optical to signal.
Dependencies are inferred from the claim text.