# US 2018/0323246 A1 · Organic light-emitting diode display panel and manufacturing method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2018/0323246 A1 - Document ID: US20180323246A1 - Status: Published application - Kind: A1 - Application number: 15/541,746 - Filed: 2017-05-27 - Published: 2018-11-08 - Earliest claimed: 2017-05-02 - Assignees: Shenzhen China Star Optoelectronics Technology Co., Ltd. - Applicants: Shenzhen China Star Optoelectronics Technology Co., Ltd. - Inventors: Xiaoxing ZHANG; Yuan-Jun HSU - Web page: https://patentgrep.com/patent/US20180323246A1 ## CPC - H10D 86/423: {comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO} - H10D 30/673: {characterised by the shapes, relative sizes or dispositions of the gate electrodes} - H10D 30/6739: {Conductor-insulator-semiconductor electrodes} - H10D 30/6755: {Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate} - H10D 30/6758: {characterised by the insulating substrates} - H10D 99/00: Subject matter not provided for in other groups of this subclass - H10K 59/124: Insulating layers formed between TFT elements and OLED elements - H10D 86/411: {characterised by materials, geometry or structure of the substrates} - H10D 86/451: {characterised by the compositions or shapes of the interlayer dielectrics} - H10D 86/60: wherein the TFTs are in active matrices - H10K 59/1201: {Manufacture or treatment} - H10K 59/1213: {the pixel elements being TFTs} - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES - H10K: ORGANIC ELECTRIC SOLID-STATE DEVICES ## Abstract The present invention provides an organic light-emitting display panel and manufacturing method thereof. The method is to use the feature that silicon nitride has more hydrogen atoms, so that the oxide semiconductor in contact with the part of oxide semiconductor pattern layer with conductor characteristics, can be continuously doped with hydrogen atoms to hold conductor characteristics, and the contact impedance between the part of oxide semiconductor pattern layer and the source and the drain can be continuously maintained at a low state to achieve the function of TFT. ## Claims ### Claim 1 A method of manufacturing an organic light-emitting diode display panel, wherein the method comprises: depositing a buffer layer on a substrate and arranging an oxide semiconductor pattern layer, a gate insulating layer, and a gate pattern layer stacked sequentially on the buffer layer; arranging a dielectric layer for covering the oxide semiconductor pattern layer, the gate insulating layer, and the gate pattern layer on the buffer layer, and the dielectric layer comprising a silicon nitride layer in contact with the oxide semiconductor pattern layer; annealing the dielectric layer, and the silicon nitride layer casing a part of oxide semiconductor pattern layer to have conductor characteristics during the annealing process; arranging a source and a drain in contact with the part of oxide semiconductor pattern layer, with conductor characteristics; wherein the buffer layer comprises a silicon oxide layer in contact with the oxide semiconductor pattern layer; wherein the gate insulating layer comprises a third part and a fourth part, the fourth part is adjacent to the third part, the third part is arranged opposite to the gate pattern layer, the fourth part is in contact with the nitrogen silicon layer. ### Claim 2 (depends on 1) The method as recited in claim 1, wherein the oxide semiconductor pattern layer comprises a first part and a second part, the second part is adjacent to the first part, the first part is arranged opposite to the gate insulating layer, the second part is in contact with the silicon nitride layer, and the above-mentioned description of annealing the dielectric layer, and the silicon nitride layer casing a part of oxide semiconductor pattern layer to have conductor characteristics during the annealing process, which comprises: annealing the dielectric layer, and the silicon nitride layer casing the second part in contact with the silicon nitride layer, to have conductor characteristics during the annealing process. ### Claim 3 (depends on 2) The method as recited in claim 2, wherein the silicon nitride layer contains hydrogen atoms, above-mentioned description of annealing the dielectric layer, and the silicon nitride layer casing the second part in contact with the silicon nitride layer, to have conductor characteristics during the annealing process, which comprises: during the annealing process, the hydrogen atoms in the silicon nitride layer diffusing to the oxide semiconductor pattern layer, so as the second part in contact with the silicon nitride layer, doped with the hydrogen atoms, thereby having conductor characteristics. ### Claim 4 (depends on 3) The method as recited in claim 3, wherein the gate insulating layer is a silicon oxide layer, the gate insulating layer and the first part arranged opposite to the gate insulating layer hold semiconductor characteristics after annealing. ### Claim 5 (depends on 1) The method as recited in claim 1, wherein the above-mentioned description of arranging a source and a drain in contact with the part of oxide semiconductor pattern layer, with conductor characteristics, which comprises: arranging a contact hole connected to a part of the oxide semiconductor pattern layer in the dielectric layer; arranging the source and the drain in contact with the part of oxide semiconductor pattern layer through the contact hole in the dielectric layer. ### Claim 6 A method of manufacturing an organic light-emitting diode display panel, wherein the method comprises: depositing a buffer layer on a substrate and arranging an oxide semiconductor pattern layer, a gate insulating layer, and a gate pattern layer stacked sequentially on the buffer layer; arranging a dielectric layer for covering the oxide semiconductor pattern layer, the gate insulating layer, and the gate pattern layer on the buffer layer, and the dielectric layer comprising a silicon nitride layer in contact with the oxide semiconductor pattern layer; annealing the dielectric layer, and the silicon nitride layer casing a part of oxide semiconductor pattern layer to have conductor characteristics during the annealing process; arranging a source and a drain in contact with the part of oxide semiconductor pattern layer, with conductor characteristics. ### Claim 7 (depends on 6) The method as recited in claim 6, wherein the oxide semiconductor pattern layer comprises a first part and a second part, the second part is adjacent to the first part, the first part is arranged opposite to the gate insulating layer, the second part is in contact with the silicon nitride layer, and the above-mentioned description of annealing the dielectric layer, and the silicon nitride layer casing a part of oxide semiconductor pattern layer to have conductor characteristics during the annealing process, which comprises: annealing the dielectric layer, and the silicon nitride layer casing the second part in contact with the silicon nitride layer, to have conductor characteristics during the annealing process. ### Claim 8 (depends on 2) The method as recited in claim 2, wherein the silicon nitride layer contains hydrogen atoms, above-mentioned description of annealing the dielectric layer, and the silicon nitride layer casing the second part in contact with the silicon nitride layer, to have conductor characteristics during the annealing process, which comprises: during the annealing process, the hydrogen atoms in the silicon nitride layer diffusing to the oxide semiconductor pattern layer, so as the second part in contact with the silicon nitride layer, doped with the hydrogen atoms, thereby having conductor characteristics. ### Claim 9 (depends on 8) The method as recited in claim 8, wherein the gate insulating layer is a silicon oxide layer, the gate insulating layer and the first part arranged opposite to the gate insulating layer hold semiconductor characteristics after annealing. ### Claim 10 (depends on 6) The method as recited in claim 6, wherein the buffer layer comprises a silicon oxide layer in contact with the oxide semiconductor pattern layer; ### Claim 11 (depends on 6) The method as recited in claim 6, wherein the gate insulating layer comprises a third part and a fourth part, the fourth part is adjacent to the third part, the third part is arranged opposite to the gate pattern layer, the fourth part is in contact with the nitrogen silicon layer. ### Claim 12 (depends on 6) The method as recited in claim 6, wherein the above-mentioned description of arranging a source and a drain in contact with the part of oxide semiconductor pattern layer, with conductor characteristics, which comprises: arranging a contact hole connected to a part of the oxide semiconductor pattern layer in the dielectric layer; arranging the source and the drain in contact with the part of oxide semiconductor pattern layer through the contact hole in the dielectric layer. ### Claim 13 An organic light-emitting diode display panel, wherein the display panel comprises: depositing a buffer layer on a substrate and arranging an oxide semiconductor pattern layer, a gate insulating layer, and a gate pattern layer stacked sequentially on the buffer layer, wherein a part of oxide semiconductor pattern layer has conductor characteristics; a dielectric layer covering the oxide semiconductor pattern layer, the gate insulating layer, and the gate pattern layer, and the dielectric layer comprising a silicon nitride layer in contact with the oxide semiconductor pattern layer; a source and a drain in contact with the part of oxide semiconductor pattern layer, with conductor characteristics. ### Claim 14 (depends on 13) The display panel as recited in claim 13, wherein the oxide semiconductor pattern layer comprises a first part and a second part, the second part is adjacent to the first part, the first part is arranged opposite to the gate insulating layer, the second part is in contact with the silicon nitride layer, thereby the second part has conductor characteristics. ### Claim 15 (depends on 14) The display panel as recited in claim 14, wherein the silicon nitride layer contains hydrogen atoms, during the manufacturing process, the hydrogen atoms in the silicon nitride layer diffuse to the oxide semiconductor pattern layer, so as the second part in contact with the silicon nitride layer, is doped with the hydrogen atoms, thereby the second part has conductor characteristics.