# US 2018/0321303 A1 · Arrangement unit, testing system and testing method

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- Number: US 2018/0321303 A1
- Document ID: US20180321303A1
- Status: Published application
- Kind: A1
- Application number: 15/935,065
- Filed: 2018-03-26
- Published: 2018-11-08
- Earliest claimed: 2017-05-03
- Assignees: Pegatron Corporation
- Applicants: Pegatron Corporation
- Inventors: Chih-Ho CHEN; Wen-Pin LI; Guo-Yuan TSENG; Yu-Ting CHEN
- Web page: https://patentgrep.com/patent/US20180321303A1

## CPC

- G01R 31/01: Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12)
- G01R 31/2834: {Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A testing system is suitable for receiving at least one testing item of multiple device under tests (DUTs). The testing system comprises a plurality of testing devices and an arrangement unit. The arrangement unit is coupled to the testing devices. The arrangement unit generates at least one testing instruction according to the at least one testing item and detects an idle state corresponding to the at least one testing instruction, and transmits the at least one testing instruction to the testing device in the idle state, so as to trigger the testing device in the idle state to test the corresponding DUT according to the at least one testing instruction and generate a testing result.

## Claims

### Claim 1

A testing system suitable for receiving at least one testing item from a plurality of device under tests (DUTs), comprising:
a plurality of testing devices configured to test the DUTs corresponding to the at least one testing item;
an arrangement unit electrically connected to the testing devices and configured to generate at least one testing instruction according to the at least one testing item, detect an idle state of the testing devices corresponding to the at least one testing item, and transmit the at least one testing instruction to the corresponding testing device in the idle state, so that the testing device in the idle state tests the corresponding DUT according to the at least one testing instruction and generates a testing result.

### Claim 2 (depends on 1)

The testing system of claim 1, wherein the testing device in the idle state is configured to test another one of the DUTs during another one of the testing devices testing the one of the DUTs.

### Claim 3 (depends on 1)

The testing system of claim 1, further comprising a switch communicatively connected to the testing devices and the DUTs, wherein the testing devices receive a testing signal transmitted by the DUTs via the switch.

### Claim 4 (depends on 1)

The testing system of claim 1, wherein the arrangement unit transmits the testing result to the corresponding DUT when the at least one of the testing device generates the testing result and transmits the testing result to the arrangement unit.

### Claim 5 (depends on 1)

The testing system of claim 1, wherein the arrangement unit is configured to dynamically arrange a testing sequence according to the idle state of the testing devices.

### Claim 6

A testing method suitable for a testing system comprising a plurality of testing devices and an arrangement unit, wherein the testing method comprises:
receiving at least one testing item from a plurality of DUTs by the arrangement unit;
detecting an idle state of the testing devices corresponding to the at least one testing item by the arrangement unit;
generating at least one testing instruction according to the at least one testing item by the arrangement unit;
transmitting the at least one testing instruction to the corresponding testing device in the idle state by the arrangement unit; and
testing the corresponding DUT according to the at least one testing instruction and generating a testing result by the testing device in the idle state.

### Claim 7 (depends on 6)

The testing method of claim 6, wherein the testing device in the idle state is able to test another one of the DUTs during another one of the testing devices testing the one of the DUTs.

### Claim 8 (depends on 6)

The testing method of claim 6, wherein the testing devices are configured to receive a testing signal from the DUTs via a switch.

### Claim 9 (depends on 6)

The testing method of claim 6, wherein the arrangement unit is configured to transmit the testing result to the corresponding DUTs when the at least one of the testing devices generates the testing result and transmits the testing result to the arrangement unit.

### Claim 10 (depends on 6)

The testing method of claim 6, wherein the arrangement unit is configured to dynamically arrange a testing sequence according to the idle state of the testing devices.

### Claim 11

An arrangement unit suitable for receiving at least one testing item of a plurality of DUTs and electrically connected to a plurality of testing devices, wherein the arrangement unit comprises:
a communication interface configured to receive the at least one testing item;
a processor electrically connected to the communication interface, and configured to generate at least one testing instruction according to the at least one testing item, detect an idle state of the testing devices corresponding to the at least one testing item, and transmit the at least one testing instruction to the corresponding testing device in the idle state, such that the testing device in the idle state is configured to test the corresponding DUT according to the at least one testing instruction and generate a testing result.