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US 2018/0306734 A1Published application
X-ray phase contrast imaging system
AssigneeShimadzu Corporation
InventorsNaoki MORIMOTO, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA
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Abstract
An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.
Claims12
An X-ray phase contrast imaging system comprising:
- an X-ray source;
- a detector configured to detect an X-ray irradiated from the X-ray source;
- a plurality of gratings disposed between the X-ray source and the detector, the plurality of gratings including a first grating for forming a self-image by being irradiated by the X-ray from the X-ray source and a second grating for forming an interference fringe with the self-image of the first grating by being irradiated by the X-ray that has passed through the first grating;
- and
- a grating positional displacement acquisition section configured to acquire a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.
2 more elements
Dependencies are inferred from the claim text.