Simultaneous scan chain initialization with disparate latches

An integrated circuit comprising:

• a reset electrically connected to a select line of a multiplexor and an OR gate, both the multiplexor and the OR gate comprise a circuit, the multiplexor receives data from a power source;
• a clock electrically connected to the OR gate;
• the OR gate electrically connected to a clock input of a first latch, the first latch includes the clock input, a scan enable input, a data input, and a data output;
• and
• a first regular logic data path electrically connected to the multiplexor, wherein a data output of a second latch drives the first regular logic data path, and the multiplexor is further electrically connected to the data port of the first latch, wherein the first latch data output is electrically connected to a second regular logic data path.