Method for the Analysis of Surface Measurements
AssigneeASMEC Advanced Surface Mechanics GmbH
InventorThomas Chudoba
Life of this patent
Estimating the term…
Abstract
A method for the analysis of surface measurements, in particular scratch tests, wear tests or profilometric measurements, wherein a graph with displayable curves in the form of measuring curves of already analyzed results with an X-axis as a coordinate axis along a measuring path is laid over a live image or subsequently over a stored image of the measuring section such that the X-coordinates in the image coincide with the X-coordinates of the curves.
Claims13
Method for the analysis of surface measurements, in particular scratch tests, wear tests or profilometric measurements, characterized in that an automatic table system is used for the position and measuring path of the area to be analyzed, wherein the table coordinates of the table system serve as a reference and that a graph with displayable curves in shape of measuring curves of already analyzed results with an X-axis as coordinate axis along the measuring path is placed in such a way over a live image or subsequently over a stored image of the measuring path that the X-coordinates in the image coincide with the X-coordinates of the curves, wherein the X-coordinates of the image and the X-coordinates of the curves can be taken from the table coordinates with respect to the travel path of the table.
Dependencies are inferred from the claim text.