Defect detection apparatus and program
AssigneeNikon-Trimble Co., Ltd.
InventorYuichi OHSHIMA
Life of this patent
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Abstract
A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.
Claims20
A defect detection apparatus comprising:
- a defect detection unit that detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument;
- and
- a calculation unit that calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.
A non-transitory computer-readable storage media comprising a program stored thereon, the program, when executed by circuitry, being configured to cause the circuitry to:
- detect a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument;
- and
- calculate defect data relating to the defect detected by the defect detection step by using coordinate data that is correlated with the external appearance image data.
Dependencies are inferred from the claim text.