Test and measurement device and operating method
AssigneeRohde & Schwarz GmbH & Co. KG
InventorTobias Frede
Life of this patent
Estimating the term…
Abstract
A test and measurement device for testing an electronic device under test comprises a test controller, which is configured to control the test and measurement device to perform tests with the electronic device under test based on respective user provided configuration parameters, and a memory device, which is coupled to the test controller, wherein the test controller is configured to automatically store for every test in the memory device a parameter set comprising the user provided parameters.
Claims20
A test and measurement device for testing an electronic device under test, the test and measurement device comprising:
- a test controller, which is configured to control the test and measurement device to perform tests with the electronic device under test based on respective user provided configuration parameters, and
- a memory device, which is coupled to the test controller,
- wherein the test controller is configured to automatically store for every test in the memory device a parameter set comprising the user provided parameters.
An operating method for operating a test and measurement device, the method comprising:
- receiving user provided configuration parameters for tests with the electronic device under test,
- performing the tests with the electronic device under test based on the received user provided configuration parameters, and
- automatically storing for every test a parameter set comprising the user provided parameters.
Dependencies are inferred from the claim text.