Apparatus and method for measuring waveform of light wave

A light wave measurement apparatus comprising:

• a pulse separation unit configured to separate an input light wave into a fundamental pulse and a signal pulse;
• a time delay adjustment unit configured to adjust a time delay between the fundamental pulse and the signal pulse;
• a focusing unit configured to focus the fundamental pulse and the signal pulse on an ionization material;
• and
• an ionization yield measurement unit configured to measure an ionization yield generated in the ionization material,
• wherein the apparatus is configured to obtain a waveform of the input light wave from an ionization yield modulation changed by the signal pulse as a function of the time delay.

A light wave measurement apparatus comprising:

• a pulse separation unit configured to separate an input light wave into a fundamental pulse and a signal pulse, wherein a field strength of the signal pulse is weaker than that of the fundamental pulse;
• and
• an ionization yield measurement unit configured to measure an ionization yield generated in the ionization material which is focused by the fundamental pulse and the signal pulse, wherein the fundamental pulse and the signal pulse have a time delay therebetween,
• wherein the apparatus is configured to obtain a waveform of the input light wave from an ionization yield modulation changed by the signal pulse as a function of the time delay.

A light wave measurement apparatus comprising:

• a pulse separation unit configured to separate an input light wave into a fundamental pulse and a signal pulse and focus the fundamental pulse and the signal pulse on a first ionization material, wherein the fundamental pulse and the signal pulse have a time delay therebetween;
• a first ionization yield measurement unit configured to measure a first ionization yield generated in the first ionization material which is focused by the fundamental pulse and the signal pulse;
• a focusing unit configured to focus only the fundamental pulse on a second ionization material;
• and
• a second ionization yield measurement unit configured to measure a second ionization yield generated in the second ionization material which is focused by only the fundamental pulse.