# US 2018/0217005 A1 · Device and components overheating evaluation > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2018/0217005 A1 - Document ID: US20180217005A1 - Status: Published application - Kind: A1 - Application number: 15/884,866 - Filed: 2018-01-31 - Published: 2018-08-02 - Earliest claimed: 2017-02-02 - Assignees: Pervacio Inc - Applicants: Pervacio Inc - Inventors: Sanjay Kanodia - Web page: https://patentgrep.com/patent/US20180217005A1 ## CPC - G01K 3/02: giving means values; giving integrated values - G01K 1/022: for recording - G01K 1/026: {arrangements for monitoring a plurality of temperatures, e.g. by multiplexing} - G01K 1/028: {arrangements for numerical indication} - G01K 1/12: for preventing damage due to heat overloading - G01K 3/06: in respect of space - G06F 9/30003: {Arrangements for executing specific machine instructions} - G08B 5/22: using electric transmission; using electromagnetic transmission - G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR (radiation pyrometry G01J5/00) - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) - G08B: SIGNALLING SYSTEMS, e.g. PERSONAL CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS ## Abstract A method for measuring temperature of a device includes measuring temperatures for each of a plurality of components or zones of the device and combining the temperatures measured into a device total temperature. A system for measuring temperature of a device includes a processor and a non-transitory memory component operatively coupled with the processor. The non-transitory memory component has, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components or zones of the device and combine the temperatures measured into a device total temperature. ## Claims ### Claim 1 A method for evaluating overheating of a device, comprising: obtaining a plurality of temperature measurements for the device; combining the obtained temperature measurements into a device total temperature; and issuing an overheating notification when the device total temperature exceeds a threshold temperature. ### Claim 2 (depends on 1) The method as set forth in claim 1, wherein obtaining the temperature measurements further comprises obtaining temperature measurements for a plurality of components of the device. ### Claim 3 (depends on 1) The method as set forth in claim 1, wherein obtaining the temperature measurements further comprises reading temperature measurements from heat sensors configured to individually measure temperature of a plurality of components of the device. ### Claim 4 (depends on 1) The method as set forth in claim 1, wherein obtaining the temperature measurements further comprises reading one or more surface temperatures. ### Claim 5 (depends on 1) The method as set forth in claim 1, wherein obtaining the temperature measurements further comprises applying a load to each of a plurality of components of the device. ### Claim 6 (depends on 1) The method as set forth in claim 1, wherein combining the obtained temperature measurements further comprises forming a linear regression model representing the device total temperature. ### Claim 7 (depends on 6) The method as set forth in claim 6, further comprising determining coefficients of the linear regression model with one or more machine learning algorithms. ### Claim 8 A system for evaluating overheating of a device, comprising: a database containing threshold temperatures for a plurality of devices; a processor; a non-transitory memory component operatively coupled with the processor and, having recorded thereto, computer readable instructions configured to cause the processor to: obtain a plurality of temperature measurements for the device being evaluated; combine the obtained temperature measurements into a device total temperature; retrieve from the database, a threshold temperature associated with the device being evaluated; and issue an overheating notification when the device total temperature exceeds a threshold temperature associated with the device being evaluated. ### Claim 9 (depends on 8) The system as set forth in claim 8, wherein the computer readable instructions are configured to cause the processor to obtain the temperature measurements by obtaining temperature measurements for a plurality of components of the device. ### Claim 10 (depends on 8) The system as set forth in claim 8, further comprising: a plurality of heat sensors configured to individually measure temperature of a plurality of components of the device; and wherein the computer readable instructions are configured to cause the processor to obtain the plurality of temperature measurements by reading temperature measurements of the plurality of heat sensors. ### Claim 11 (depends on 8) The system as set forth in claim 8, wherein the computer readable instructions are further configured to cause the processor to obtain the temperature measurements by reading a plurality of surface temperatures. ### Claim 12 (depends on 8) The system as set forth in claim 8, wherein the computer readable instructions are configured to cause the processor to apply a load to each of a plurality of components of the device. ### Claim 13 (depends on 8) The system as set forth in claim 8, wherein the computer readable instructions are configured to cause the processor to form a linear regression model representing the device total temperature. ### Claim 14 (depends on 13) The system as set forth in claim 13, wherein the computer readable instructions are configured to cause the processor to determine coefficients of the linear regression model with one or more machine learning algorithms. ### Claim 15 A non-transitory computer-readable storage medium, having recorded thereto, computer readable instructions configured to evaluate overheating of a device, wherein the instructions, when executed, cause one or more processors to: obtain a plurality of temperature measurements for the device; combine the obtained temperature measurements into a device total temperature; and issue an overheating notification when the device total temperature exceeds a threshold temperature associated with the device. ### Claim 16 (depends on 15) The non-transitory computer-readable storage medium as set forth in claim 15, wherein the computer readable instructions are configured to cause the processor to obtain the temperature measurements by obtaining temperature measurements for a plurality of components of the device. ### Claim 17 (depends on 15) The non-transitory computer-readable storage medium as set forth in claim 15, wherein the computer readable instructions are configured to cause the processor to obtain the plurality of temperature measurements by reading temperature measurements of a plurality of heat sensors configured to individually measure temperature of a plurality of components of the device. ### Claim 18 (depends on 15) The non-transitory computer-readable storage medium as set forth in claim 15, wherein the computer readable instructions are further configured to cause the processor to obtain the temperature measurements by reading a plurality of surface temperatures. ### Claim 19 (depends on 15) The non-transitory computer-readable storage medium as set forth in claim 15, wherein the computer readable instructions are further configured to cause the processor to apply a load to each of the plurality of components. ### Claim 20 (depends on 15) The non-transitory computer-readable storage medium as set forth in claim 15, wherein the computer readable instructions are further configured to cause the processor to form a linear regression model representing the device total temperature. ### Claim 21 (depends on 20) The non-transitory computer-readable storage medium as set forth in claim 20, wherein the computer readable instructions are further configured to cause the processor to determine coefficients of the linear regression model with one or more machine learning algorithms. ### Claim 22 A system for measuring temperature of a device, comprising: a processor; and a non-transitory memory component operatively coupled with the processor and having, recorded thereto, computer readable instructions configured to cause the processor to measure temperatures for each of a plurality of components of the device and combine the temperatures measured for the plurality of components into a device total temperature.