Kelvin probe system with a rotating probe face

A calibration system for a Kelvin probe system for analyzing a sample for testing, the Kelvin probe system comprising:

• a drive controlled and powered by a drive control/power for rotating an object around a rotational axis,
• a Kelvin probe head connected to the drive, comprising a Kelvin probe, having at one end a Kelvin probe face,
• wherein the Kelvin probe face is provided on a side face of the Kelvin probe head with respect to the rotational axis, and
• a calibration sample located away from a sample to be measured, wherein the calibration sample operates as a built-in reference surface for the calibration of the rotating Kelvin Probe.

A method for measuring the presence of hydrogen using a Kelvin probe system, the Kelvin probe system including:

• a drive controlled and powered by a drive control/power for rotating an object around a rotational axis,
• a Kelvin probe head connected to the drive, comprising a Kelvin probe, having at one end a Kelvin probe face,
• wherein the Kelvin probe face is provided on a side face of the Kelvin probe head with respect to the rotational axis,
• wherein the method comprises having the Kelvin probe system measure at least one from the group of surface charges and interface dielectric constants, at a metallic interface in a sample to be measured.