Peak current evaluation system and peak current evaluation method
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYu-Tao YANG, Wen-Shen CHOU, Yung-Chow PENG
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYu-Tao YANG, Wen-Shen CHOU, Yung-Chow PENG
Estimating the term…
A peak current evaluation apparatus for an IC is provided. The peak current evaluation apparatus includes a pulse tuner and a testing circuit. The pulse tuner receives a clock signal, adjusts pulse width and duty ratio of the clock signal according to at least one predetermined parameter in order to generate a pulse signal with a stress voltage. The testing circuit is coupled to the pulse tuner. The testing circuit, which includes two input ports, receives the pulse signal at one of the two input ports in order to stress a testing device, measures the resistance value of the testing device, and calculates the peak current of the testing device when the resistance value increases and exceeds a threshold value.
A peak current evaluation apparatus, comprising:
A peak current evaluation system, comprising:
A peak current evaluation method, comprising:
Dependencies are inferred from the claim text.