Method for generating a value inherent to an electronic circuit, electronic circuit generating this value and method for using such a value

A method for generating a value inherent to an electronic circuit by measuring a physical quantity carried out on components of the electronic circuit, comprising:

• calculating and associating with each component a derived value, the derived value being derived from a series of measurements carried out on said component, the calculating of said derived value comprising:
• determining a statistical value from said series of measurements;
• and
• defining said derived value as being said statistical value or an uncertainty range calculated from said statistical value;
• forming a collection of invariable pairs of components;
• selecting, in said collection, pairs of components so that derived values associated with the components of each one of these pairs are spaced from each other by at least a setpoint value;
• generating said value inherent to the electronic circuit by concatenating the results of comparisons based on at least one of the derived values associated with the components of each selected pair of components, and data including at least one datum derived from the derived values associated with the components of each selected pair of components;
• said results being processed in an invariable order and said derived values or data relative to the pairs of components processed during said comparisons also being processed in an invariable order.