Method of Manufacturing Lower Temperature Polycrystal Silicon Thin Film Transistor Array Substrate
AssigneeShenzhen China Star Optoelectronics Technology Co., Ltd.
InventorMacai LU
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Abstract
A method of manufacturing an array substrate, the method including the steps of: A) defining a heavily doped region and a lightly doped region of a source electrode of an N-channel area, and a heavily doped region and a lightly doped region of a drain electrode of the N-channel area by using a first stripped photomask; B) defining a doped region of a source electrode of a P-channel area and a doped region of a drain electrode of the P-channel area by using a second stripped photomask; C) defining a pixel region, a contact hole region by using a third stripped photomask; and D) defining a metal electrode region by using a fourth stripped photomask.
Claims13
A method of manufacturing lower temperature polycrystal silicon thin film transistor array substrate, comprising:
- A) defining a heavily doped region of a source electrode of an N-channel area, a lightly doped region of the source electrode of the N-channel area, a heavily doped region of a drain electrode of the N-channel area and a lightly doped region of the drain electrode of the N-channel area by using a first stripped photomask;
- B) defining a doped region of a source electrode of a P-channel area and a doped region of a drain electrode of the P-channel area by using a second stripped photomask;
- C) defining a pixel region, a contact hole region at the heavily doped region of the drain electrode of the N-channel area, a contact hole region at the heavily doped region of the source electrode of the N-channel area, a contact hole region at the heavily doped region of the drain electrode of the P-channel area, and a contact hole region at the heavily doped region of the source electrode of the P-channel area by using a third stripped photomask;
- and
- D) defining a metal electrode region at the heavily doped region of the drain electrode of the N-channel area, a metal electrode region at the heavily doped region of the source electrode of the N-channel area, a metal electrode region at the heavily doped region of the drain electrode of the P-channel area, and a metal electrode region at the heavily doped region of the source electrode of the P-channel area by using a fourth stripped photomask.
Dependencies are inferred from the claim text.