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US 2018/0122632 A1Published application
Use of silyl bridged alkyl compounds for dense osg films
AssigneeVersum Materials US, LLC
InventorsRaymond Nicholas Vrtis, Robert Gordon Ridgeway, Jennifer Lynn Anne Achtyl, William Robert Entley, Dino Sinatore, Kathleen Esther Theodorou, Andrew J. Adamczyk
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Abstract
Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same.
Claims28
A chemical vapor deposition method for depositing an organosilicate film on at least a part of a substrate, the process comprising the steps of:
- providing a substrate within a vacuum chamber;
- introducing into the vacuum chamber a gaseous structure forming composition comprising at least one organosilicon precursor selelcted from the group consisting of Formula (I) and Formula (II):
- wherein,
- R1, R2, R3, R4, R5, and R6 are each independently selected from the group consisting of —CH3 and —OR8, wherein R8 is a C1-C4 alkyl group;
- R7 is H or —CH3;
- x is 1 or 2;
- and
- n is 1, 2, 3, or 4, wherein at least one R7 is —CH3 when n is 1;
- applying energy to the gaseous structure forming composition in the vacuum chamber to induce reaction of the at least one organosilicon precursor to deposit a film on at least a portion of the substrate.
6 more elements
Dependencies are inferred from the claim text.