Counting stacked planar substrates
AssigneeDas-Nano, S.L.
InventorsGuillermo BARBADILLO VILLANUEVA, Eduardo AZANZA LADRÓN, Magdalena CHUDZIK, Mikel SUBIZA GARCÍA, Alex LÓPEZ ZORZANO, Daniel ZABALA RAZQUIN
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Abstract
Devices and methods for counting planar substrates stacked on a first plane are disclosed. Image capturing sensors are arranged collinearly in a manner substantially perpendicular to the first plane. The image capturing sensors are configured to capture images of portions of counting sides of the stacked planar substrates. The image capturing sensors are configured so that the images captured by every two consecutive image capturing sensors comprise an overlapping portion of the stacked planar substrates.
Claims29
A device for counting planar substrates stacked on a first plane, comprising:
- image capturing sensors arranged collinearly, substantially perpendicularly to the first plane, each image capturing sensor being configured to capture an image of a portion of a counting side of the stacked planar substrates, the image capturing sensors being coupled to a preprocessing module for preprocessing the captured images and to identify errors in the counting of the stacked planar substrates,
- wherein the image capturing sensors are configured so that images captured by every two consecutive image capturing sensors comprise an overlapping portion of the stacked planar substrates.
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A method of counting planar substrates stacked on a first plane, comprising:
- capturing multiple images of the stacked planar substrates, the multiple images containing a complete counting side of the stacked planar substrates, wherein each image contains a portion of the complete counting side, wherein any two consecutive images captured comprise an overlapping part of the complete counting side;
- preprocessing the captured images;
- identifying the overlapping parts of each of the two consecutive captured images;
- identifying each individual substrate;
- counting the identified individual substrates;
- and
- identifying errors in the counting of the identified individual substrates.
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Non-transitory computer readable medium storing a program that causes a computer to:
- capture multiple images of stacked planar substrates, the multiple images containing a complete counting side of the stacked planar substrates, wherein each image contains a portion of the counting side, and wherein any two consecutive images captured comprise an overlapping part of the counting side of the stacked planar substrates;
- preprocess the captured images;
- identify the overlapping parts of the two consecutive captured images;
- identify each individual substrate of the stacked planar substrates;
- count the identified individual substrates;
- and
- identify errors in the counting of the identified individual substrates.
A device for counting planar substrates stacked on a first plane, comprising:
- one or more image capturing sensors arranged substantially perpendicularly to the first plane, the one or more image capturing sensors being configured to capture images of a counting side of the stacked planar substrates,
- a preprocessing module coupled to the one or more image capturing sensors, the preprocessing module being configured to receive and preprocess the captured images and to identify individual substrates in the counting of the stacked planar substrates.
Dependencies are inferred from the claim text.