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US 2018/0060161 A1Published application
Patterned bit in error measurement apparatus and method
AssigneeSeagate Technology LLC
InventorsJeon Seokhun, Oh Sungchul, Jung Pil-Woo, Jeong Seungyoul
Life of this patent
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Abstract
A method includes detecting different data patterns in data read from a portion of a non-transitory data storage medium. Bit errors in the different data patterns are then determined. Further, bits in error for a total number of bits in each of the different data patterns are calculated from the determined bit errors in the different data patterns.
Claims20
A method comprising:
- detecting different data patterns in data read from a portion of a non-transitory data storage medium;
- determining bit errors in the different data patterns;
- and
- separately calculating bits in error for a total number of bits in each of the different data patterns from the determined bit errors in the different data patterns.
1 more element
A data storage device comprising:
- a data storage medium;
- and
- a read element configured to read data stored on the data storage medium;
- and
- a read channel, communicatively couple to the read element, wherein the read channel is configured to:
- detect different data patterns in data read from a portion of the data storage medium;
- determine bit errors in the different data patterns;
- and
- separately calculate bits in error for a total number of bits in each of the different data patterns from the determined bit errors in the different data patterns.
6 more elements
A method comprising:
- writing different predetermined data patterns to different portions of a segment of a data storage medium;
- reading the different predetermined data patterns from the different portions of the segment of the data storage medium to obtain read data patterns;
- determining bit errors in the read data patterns;
- and
- calculating a segment-level bit in error value for the segment from the determined bit errors.
2 more elements
Dependencies are inferred from the claim text.