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US 2018/0059171 A1Published application
Systems and methods for storing frequency information for system calibration/trimming
AssigneeMicrochip Technology Incorporated
InventorsAjay Kumar, Hyunsoo Yeom
Life of this patent
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Abstract
Embodiments of the present disclosure include a microcontroller with a frequency test circuit, a device-under-test (DUT) input, and a calculation engine circuit. The calculation engine circuit is configured to compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency stored in memory, and, based on the comparison, adjust frequency of the DUT generating the DUT input.
Claims20
An integrated circuit, comprising:
- a frequency test circuit;
- a device-under-test (DUT) input;
- and
- a calculation engine circuit configured to:
- compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency stored in memory;
- and
- based on the comparison, adjust frequency of the DUT generating the DUT input.
4 more elements
A microcontroller, comprising:
- a frequency test circuit;
- a device-under-test (DUT) input;
- and
- a calculation engine circuit configured to:
- compare a measured frequency from the frequency test circuit measured from the DUT input to a reference frequency stored in memory;
- and
- based on the comparison, adjust frequency of the DUT generating the DUT input.
4 more elements
A method, comprising:
- selecting an input mode of an integrated circuit, the integrated circuit operable in the input mode to store reference frequencies;
- applying a reference frequency to a frequency test circuit of the integrated circuit;
- measuring a resulting frequency from the frequency test circuit;
- and
- storing a digital code representing the resulting frequency to memory of the integrated circuit.
2 more elements
Dependencies are inferred from the claim text.