# US 2018/0025486 A1 · Defect Detection Device and Production System

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- Number: US 2018/0025486 A1
- Document ID: US20180025486A1
- Status: Published application
- Kind: A1
- Application number: 15/720,077
- Filed: 2017-09-29
- Published: 2018-01-25
- Earliest claimed: 2017-01-05
- Assignees: Nissan Motor Co., Ltd.
- Applicants: Nissan Motor Co., Ltd.
- Inventors: Hirohisa Shibayama; Eiji Shiotani; Satoru Sakurai; Kiyokazu Sugiyama; Akira Shimizu; Daisuke Terada; Yoshitsugu Noshi; Yoshito Utsumi
- Web page: https://patentgrep.com/patent/US20180025486A1

## CPC

- G06T 7/0004: {Industrial image inspection}
- B05B 9/01: Spray pistols, {discharge devices}(B05B9/03 takes precedence)
- B05B 13/06: specially designed for treating the inside of hollow bodies (spray heads B05B1/00 - B05B7/00; {devices for covering leaks in pipes or hoses, e.g. hose-menders, from inside the pipe F16L55/162; sprayed layers of rubber or plastics for internal protection of pipes or pipe fittings against corrosion or incrustation F16L58/1027})
- B23Q 17/24: using optics {or electromagnetic waves}
- B24B 33/02: designed for working internal surfaces of revolution, e.g. of cylindrical or conical shapes
- G01B 11/22: for measuring depth
- G01B 11/30: for measuring roughness or irregularity of surfaces
- G01N 21/88: Investigating the presence of flaws or contamination
- G01N 21/954: Inspecting the inner surface of hollow bodies, e.g. bores
- G06T 7/507: from shading (G06T7/586 takes precedence)
- G06T 7/62: of area, perimeter, diameter or volume
- G01N 2021/9548: {Scanning the interior of a cylinder}
- G01N 2201/10: Scanning
- G01N 2201/12: Circuits of general importance; Signal processing
- G06T 2207/30108: Industrial image inspection
- G06T 2207/30148: Semiconductor; IC; Wafer
- G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- B05B: SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES (spray-mixers with nozzles B01F25/72; processes for applying liquids or other fluent materials to surfaces by spraying B05D)
- B23Q: DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING (tools of the kind used in lathes or boring machines B23B27/00); MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B24B: MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING (grinding of gear teeth B23F, of screw-threads B23G1/36; by electro-erosion B23H; abrasive or related blasting B24C; tools for grinding, buffing or sharpening B24D; polishing compositions C09G1/00; abrasives C09K3/14; electrolytic etching or polishing C25F3/00; grinding arrangements for use on assembled railway tracks E01B31/17); DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.

## Claims

### Claim 1

A defect detection device comprising:
a camera configured to image an image of an inspection object;
a binarization processor configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image;
a ratio calculation processor configured to calculate a first ratio of the second size to the first size; and
a depth determination processor configured to determine a depth of the defect depending on the first ratio.

### Claim 2 (depends on 1)

The defect detection device according to claim 1, further comprising:
a volume calculation processor configured to calculate a volume of the defect depending on the depth of the defect determined, and calculate a sum of volumes of all defects in the image; and
a quality determination processor configured to determine whether the inspection object is fine or inferior according to the sum of the volumes of the all defects.

### Claim 3 (depends on 1)

The defect detection device according to claim 1, wherein:
the binarization processing processor subjects the image to third binarization processing by use of a third binarization threshold different from the first and second binarization thresholds, so as to calculate a third size for the identical defect in the image;
the ratio calculation processor calculates a second ratio of the third size to the first size; and
the depth determination processor determines a depth of the defect depending on the first and second ratios.

### Claim 4 (depends on 1)

The defect detection device according to claim 1, wherein the depth determination processor compares the first ratio with each of a plurality of thresholds different from each other to determine depths of the defect several times, so as to comprehensively evaluate the depth of the defect according to the depths determined several times.

### Claim 5 (depends on 1)

The defect detection device according to claim 1, wherein:
the inspection object is a cylinder block of an engine; and
the defect includes at least a pit and a blowhole.

### Claim 6

A production system comprising:
a defect detection device comprising:
a camera configured to image an image of an inspection object;
a binarization processor configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image;
a ratio calculation processor configured to calculate a first ratio of the second size to the first size;
a depth determination processor configured to determine a depth of the defect depending on the first ratio; and
a volume calculation processor configured to calculate a volume of the defect depending on the depth of the defect determined, and calculate a sum of volumes of all defects in the image, and
a gun body and a spray gun attached to the gun body configured to arrange a processing condition for the inspection object according to the sum of the volumes of the all defects.
