Semiconductor device and manufacturing method therefor
AssigneeRenesas Electronics Corporation
InventorsTsuyoshi KACHI, Yoshinori HOSHINO, Senichirou NAGASE
Life of this patent
Estimating the term…
Loading patent…
AssigneeRenesas Electronics Corporation
InventorsTsuyoshi KACHI, Yoshinori HOSHINO, Senichirou NAGASE
Estimating the term…
Provided are a semiconductor device and a manufacturing method therefor that can prevent the breakage of an element and in which the control of impurity amounts is less susceptible to variations in manufacturing processes. A semiconductor substrate has a front surface and includes hole portions extending from the front surface to an inside of the substrate. N-type regions are formed in the semiconductor substrate. At wall surfaces of the hole portions, p-type regions are formed to configure p-n junction with the n-type regions. Each of the p-type regions includes a low-concentration region and a high-concentration region formed at the wall surface of each hole portion. A width of the high-concentration region along the wall surface of the hole portion becomes smaller from the front surface toward a deeper position.
A semiconductor device, comprising:
A method for manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.