Testing non-volatile memories

A computer program product comprising:

• one or more computer readable storage media and program instructions stored on the one or more computer readable storage media, the program instructions comprising instructions executable by a computer to perform:
• receiving probability distribution function data corresponding to bit-error-rate data for each of a plurality of data blocks within a qualified set of NVRAMS;
• collecting non-exhaustive bit-error-rate data for each of the plurality of data blocks on a tested NVRAM to produce non-exhaustive test data for each of the plurality of data blocks;
• determining a plurality of stable data blocks on the tested NVRAM based on the non-exhaustive test data and the probability distribution function data for each of the plurality of data blocks;
• determining, from the non-exhaustive test data, an inferior data block for the plurality of stable data blocks on the tested NVRAM;
• collecting exhaustive bit-error-rate data on the inferior data block to produce exhaustive test data for the tested NVRAM;
• and
• processing or routing the tested NVRAM according to the exhaustive test data.

A computer system comprising:

• one or more computers;
• one or more computer readable storage media and program instructions stored on the one or more computer readable storage media for execution by at least one of the computers, the program instructions comprising instructions executable by a computer to perform:
• receiving probability distribution function data corresponding to bit-error-rate data for each of a plurality of data blocks within a qualified set of NVRAMS;
• collecting non-exhaustive bit-error-rate data for each of the plurality of data blocks on a tested NVRAM to produce non-exhaustive test data for each of the plurality of data blocks;
• determining a plurality of stable data blocks on the tested NVRAM based on the non-exhaustive test data and the probability distribution function data for each of the plurality of data blocks;
• determining, from the non-exhaustive test data, an inferior data block for the plurality of stable data blocks on the tested NVRAM;
• collecting exhaustive bit-error-rate data on the inferior data block to produce exhaustive test data for the tested NVRAM;
• and
• processing or routing the tested NVRAM according to the exhaustive test data.