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US 2018/0009707 A1Published application
Glass sheet
AssigneeAsahi Glass Company, Limited
InventorsTakenori Miura, Satoshi Miyasaka, Yasuo Hayashi, Kazuhiko Yamanaka
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Abstract
A glass sheet includes a first main surface and a second main surface opposite to the first main surface in a thickness direction. X represented by the following formula (1) is −0.29<X<0.29: A×Δ1H/30Si+B×ΔNa2O+C×ΔSn+D×ΔF=X (1). F0-3 determined according to the following formula (II) is 0.02 or more: F0-3=[average fluorine concentration (wt %) by SIMS at depth of 0 to 3 μm in first main surface]×3 (II).
Claims4
A glass sheet comprising a first main surface and a second main surface opposite to the first main surface in a thickness direction, wherein
- X represented by the following formula (1) is −0.29<X<0.29;
- and
- F0-3 determined according to the following formula (II) is 0.02 or more:
- A×Δ1H/30Si+B×ΔNa2O+C×ΔSn+D×ΔF=X (1)
- wherein in the formula (1), each parameter has the following meaning:
- A1H/30Si:
- a value of difference obtained by subtracting an average count by secondary ion mass spectroscopy (SIMS) at a depth of 3 to 12 μm in the second main surface from an average 1H/30Si count by SIMS at a depth of 3 to 12 μm in the first main surface;
- ΔNa2O:
- a value of difference obtained by subtracting an average Na2O concentration (wt %) by XRF at a depth of 0 to 3 μm in the second main surface from an average Na2O concentration (wt %) by XRF at a depth of 0 to 3 μm in the first main surface;
- ΔSn:
- a value of difference obtained by subtracting Tin count as an indicator of tin content in a glass by XRF at a depth of 0 to 10 μm in the second main surface from the value of Tin count as an indicator of tin content in a glass by XRF at a depth of 0 to 10 μm in the first main surface;
- ΔF:
- a value of difference obtained by subtracting an average fluorine concentration (wt %) by SIMS×12 at a depth of 0 to 12 μm in the second main surface from an average fluorine concentration (wt %) by SIMS×12 at a depth of 0 to 12 μm in the first main surface;
- A:
- −128.95;
- B:
- 1;
- C:
- −0.0002428;
- and
- D:
- −0.009922:
- and
- F0-3=[average fluorine concentration by SIMS at depth of 0 to 3 μm in first main surface]×3 (II).
21 more elements
Dependencies are inferred from the claim text.