Systems, methods, and apparatuses for implementing a virtual device observation and debug network for high speed serial ios

A method in a functional semiconductor device, the method comprising:

• originating transactions from a transaction originator of the functional semiconductor device;
• issuing the transactions onto a device fabric of the functional semiconductor device from the transaction originator, the issued transactions being directed toward a serial Input/Output interface (serial IO interface) of the functional semiconductor device by the transaction originator;
• receiving the transactions at the serial IO interface via a virtualized device logic embedded within the serial IO interface of the functional semiconductor device;
• returning responsive transactions to the device originator based on the transactions received;
• collecting signal information via signature collection logic embedded within the functional semiconductor device based on the transactions carried by the device fabric;
• and
• generating, via a signal accumulator of the functional semiconductor device, a test signature based on the signal information collected by the signature collection logic.

A system comprising:

• a CPU core module (processor) and a memory to execute instructions;
• a printed circuit board (PCB) motherboard having the memory mounted thereupon;
• and
• a functional semiconductor device mounted to the PCB motherboard, the functional semiconductor device comprising:
• (i) the processor;
• (ii) a serial Input/Output interface (serial IO interface);
• (iii) a device fabric to carry transactions between a plurality of components of the functional semiconductor device;
• (iv) a transaction originator to originate a transactions and issue the transactions onto the device fabric directed toward the serial IO interface, wherein the virtualized device logic is to receive the transactions at the serial IO interface via the device fabric and return responsive transactions to the device originator based on the transactions received;
• (v) signature collection logic to collect signal information based on the transactions carried by the device fabric;
• and
• (vi) a signal accumulator to generate a test signature based on the signal information collected by the signature collection logic.