Compact system for characterizing a device under test (dut) having integrated antenna array

A system for characterizing a device under test (DUT) comprising an integrated antenna array, the system comprising:

• a curved mirror having a first focal plane, wherein the integrated antenna array is positioned substantially on the first focal plane of the curved mirror;
• and
• a measurement array comprising a plurality of detectors substantially positioned on a second focal plane of the curved mirror, the plurality of detectors being configured to receive signals transmitted from the integrated antenna array and reflected by the curved mirror,
• wherein a far-field radiation pattern of the integrated antenna array is created at the measurement array, enabling measurements of DUT parameters at each detector of the plurality of detectors from the signals transmitted from the integrated antenna array.

A system for characterizing a device under test (DUT) comprising an integrated antenna array, the system comprising:

• a lens having a first focal plane on one side of the lens and a second focal plane on an opposite side of the lens, wherein the integrated antenna array is positioned substantially on the first focal plane of the lens;
• and
• a measurement array comprising a plurality of detectors substantially positioned on the second focal plane of the lens, the plurality of detectors being configured to receive signals transmitted from the integrated antenna array through the lens,
• wherein a far-field radiation pattern of the integrated antenna array is created at the measurement array, enabling measurements of DUT parameters at each detector of the plurality of detectors from the signals transmitted from the integrated antenna array.