Semiconductor device and manufacturing method of semiconductor device
AssigneesFuji Electric Co., Ltd., Octec Inc.
InventorsKoh YOSHIKAWA, Haruo NAKAZAWA, Kenichi IGUCHI, Yasukazu SEKI, Katsuya OKUMURA
Life of this patent
Estimating the term…
Loading patent…
AssigneesFuji Electric Co., Ltd., Octec Inc.
InventorsKoh YOSHIKAWA, Haruo NAKAZAWA, Kenichi IGUCHI, Yasukazu SEKI, Katsuya OKUMURA
Estimating the term…
A semiconductor device having a voltage resistant structure in a first aspect of the present invention is provided, comprising a semiconductor substrate, a semiconductor layer on the semiconductor substrate, a front surface electrode above the semiconductor layer, a rear surface electrode below the semiconductor substrate, an extension section provided to a side surface of the semiconductor substrate, and a resistance section electrically connected to the front surface electrode and the rear surface electrode. The extension section may have a lower permittivity than the semiconductor substrate. The resistance section may be provided to at least one of the upper surface and the side surface of the extension section.
A manufacturing method of a semiconductor device having a voltage resistant structure, the manufacturing method of the semiconductor device comprising:
Dependencies are inferred from the claim text.