Apparatus for physical vapor deposition reactive processing of thin film materials
AssigneeHIA, Inc.
InventorsSamuel D. Harkness, IV, Quang N. Tran
Life of this patent
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AssigneeHIA, Inc.
InventorsSamuel D. Harkness, IV, Quang N. Tran
Estimating the term…
An apparatus has a cathode target with a cathode target outer perimeter. An inner magnetic array with an inner magnetic array inner perimeter is at the cathode target outer perimeter. An outer magnetic array has an outer magnetic array outer perimeter larger than the inner magnetic array inner perimeter. The inner magnetic array and the outer magnetic array are concentric and each have a single, common, parallel magnetic orientation to form a magnetic field environment that defines a plasma confinement zone adjacent the target cathode and the plasma confinement zone causes a gas operative as a reactive gas and sputter gas to become ionized and thus be directed to the target cathode and cause a second set of ions including species from the target to disperse across a substrate.
An apparatus, comprising:
Dependencies are inferred from the claim text.