System and method for detecting defects in a component

A device for inspecting a component, the device comprising:

• an inductive coil configured to induce an electrical current flow into the component;
• an infrared (IR) camera configured to capture at least a first set of frames at a first time interval and a second set of frames at a second time interval, wherein the first and second set of frames correspond to at least a portion of the component;
• a processing unit electrically coupled to the IR camera and configured to:
• construct a thermal image based on at least the first set of frames and the second set of frames;
• and
• determine presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.

A method for detecting multiple defects in a component, the method comprising:

• translating, by a motion controller, an inductive coil within at least a portion of the component, wherein the portion of the component is disposed between a first end and a second end of the component;
• inducing, by an inductive coil, an electrical current flow into the component, wherein the component comprises at least a crack having a first orientation and a crack having a second orientation;
• capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval;
• constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component;
• and
• determining presence of a first thermal signature associated with the crack having the first orientation and a second thermal signature associated with the crack having the second orientation in the thermal image of the component.