Inspection system
AssigneeOMRON Corporation
InventorsYuki KIMURA, Akira MATSUI, Shingo INAZUMI
Life of this patent
Estimating the term…
Abstract
An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device; the inspection device including: a substantially column-shaped first barrel that includes a first through hole configured for an object to pass therethrough; and a plurality of imaging units provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection.
Claims19
An inspection system comprising:
- an inspection device configured to examine the external features of an object;
- and a control device for controlling the inspection device;
- the inspection device including:
- a substantially column-shaped first barrel that includes a first through hole configured for an object to pass therethrough;
- and
- a plurality of imaging units provided on the inner peripheral surface which forms the first through hole in the first barrel;
- and
- the control device including:
- an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection.
An inspection system comprising:
- an inspection device configured to examine the external features of an object;
- and a control device for controlling the inspection device;
- the inspection device including:
- a substantially column-shaped second barrel that includes a second through hole configured for an object to pass therethrough;
- and
- a plurality of measurement sensors provided on the inner peripheral surface of the second barrel and configured to measure the external features of the object;
- the control device including:
- a measurement processing unit configured to process the measurement values output from the measurement sensors for the purpose of inspection.
Dependencies are inferred from the claim text.