Predicting problem events from machine data
AssigneeAlcatel-Lucent USA Inc.
InventorsAhmet Akyamac, Huseyin Uzunalioglu
Life of this patent
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AssigneeAlcatel-Lucent USA Inc.
InventorsAhmet Akyamac, Huseyin Uzunalioglu
Estimating the term…
The present disclosure generally discloses a problem event prediction capability. The problem event prediction capability may be configured to predict various types of problem events (e.g., customer problems, customer tickets, customer outages, network problems, network tickets, network outages, or the like, as well as various combinations thereof) based on various types of asynchronous machine data (e.g., alarms, alerts, triggers, machine logs, machine messages, diagnostic logs, diagnostic messages, or the like, as well as various combinations thereof). The problem event prediction capability may be configured to generate a set of problem prediction rules based on historical machine data and to apply the problem prediction rules to observed machine data in order to predict various types of problem events.
An apparatus, comprising:
A method, comprising:
An apparatus, comprising:
The apparatus of claim 11, wherein, to create the temporal association between the historical problem event data associated with the device and the machine data generated by the device, the processor is configured to:
A method, comprising:
Dependencies are inferred from the claim text.