Innovative high speed serial controller testing
AssigneeIntel Corporation
InventorsLAKSHMINARAYANA PAPPU, TIMOTHY J. CALLAHAN, HEM DOSHI, HOOI KAR LOO, SUKETU U. BHATT
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AssigneeIntel Corporation
InventorsLAKSHMINARAYANA PAPPU, TIMOTHY J. CALLAHAN, HEM DOSHI, HOOI KAR LOO, SUKETU U. BHATT
Estimating the term…
In accordance with disclosed embodiments, there are provided systems, methods, and apparatuses for implementing SoC coverage through virtual devices in PCIe and DMI controllers. According to one embodiment there is a functional semiconductor device, having therein a serial Input/Output interface (serial IO interface); a device fabric to carry transactions between a plurality of components of the functional semiconductor device; virtualized device logic embedded within the serial IO interface; a transaction originator to originate a shuttle transaction and to issue the shuttle transaction onto the device fabric directed toward the serial IO interface; in which the shuttle transaction includes a shuttle header and a shuttle payload having embedded therein one or more passenger transactions for issuance onto the device fabric; in which the virtualized device logic is to receive the shuttle transaction at the serial IO interface via the device fabric; in which the virtualized device logic is to strip the shuttle header from the shuttle transaction to expose the one or more passenger transactions; and in which the virtualized device logic is to issue the one or more passenger transactions onto the device fabric. Other related embodiments are disclosed.
A functional semiconductor device, comprising:
A method in a functional semiconductor device, the method comprising:
A system comprising:
Dependencies are inferred from the claim text.