Innovative high speed serial controller testing
AssigneeIntel Corporation
InventorsLAKSHMINARAYANA PAPPU, TIMOTHY J. CALLAHAN, HEM DOSHI, HOOI KAR LOO, SUKETU U. BHATT
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AssigneeIntel Corporation
InventorsLAKSHMINARAYANA PAPPU, TIMOTHY J. CALLAHAN, HEM DOSHI, HOOI KAR LOO, SUKETU U. BHATT
Estimating the term…
In accordance with disclosed embodiments, there are provided systems, methods, and apparatuses for implementing high speed serial controller testing. For instance, in accordance with one embodiment, there is a functional semiconductor device, comprising: a serial Input/Output interface (serial IO interface); a device fabric to carry transactions between a plurality of components of the functional semiconductor device; virtualized device logic embedded within the serial IO interface; a transaction originator to originate a transaction and issue the transaction onto the device fabric directed toward the serial IO interface; in which the virtualized device logic is to receive the transaction at the serial IO interface via the device fabric; in which the virtualized device logic is to modify the transaction received to form a modified transaction; in which the virtualized device logic is to issue the modified transaction onto the device fabric; and in which the modified transaction is returned to the transaction originator. Other related embodiments are disclosed.
A functional semiconductor device, comprising:
A method in a functional semiconductor device, the method comprising:
A system comprising:
Dependencies are inferred from the claim text.