Masking Defective Bits in a Storage Array
AssigneePure Storage, Inc.
InventorsJohn D. Davis, John Hayes, Hari Kannan, Nenad Miladinovic, Zhangxi Tan
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Abstract
A method of failure mapping is provided. The method includes determining that a non-volatile memory block in the memory has a defect and generating a mask that indicates the non-volatile memory block and the defect. The method includes reading from the non-volatile memory block with application of the mask, wherein the reading and the application of the mask are performed by the non-volatile solid-state storage.
Claims20
A method of failure mapping in a storage system, performed by the storage system, comprising:
- determining a failed flash memory die in storage memory of the storage system;
- mapping around the failed flash memory die;
- and
- writing to or reading from the storage memory, in accordance with the mapping.
A tangible, non-transitory, computer-readable media having instructions thereupon which, when executed by a processor, cause the processor to perform a method comprising:
- determining one or more flash memory dies are defective in storage memory of the storage system;
- mapping around the one or more flash memory dies that are defective;
- and
- writing to or reading from the storage memory, through the mapping.
A storage system, comprising:
- flash memory-based storage memory;
- and
- one or more processors, configurable to:
- determine one or more failed flash memory dies in the storage memory;
- develop mapping around the one or more failed flash memory dies;
- and
- write to or read from the storage memory, using the mapping.
Dependencies are inferred from the claim text.