Diagnosing failure locations of an integrated circuit with logic built-in self-test

A method comprising:

• storing compressed multiple input shift register (MISR) expect data for each scan cell of each scan chain of each channel scanned from a passing integrated circuit (IC);
• storing a failure location of a latch translated from signature fail data from the MISR in an isolation hatch table (IHT);
• running a standard test, using circuit under test (CUT) MISR data, of the CUT, where for each scan cell of each scan chain of each channel at least one compressed MISR signature does not match the MISR expect data and where translated bits of the at least one compressed MISR signature match an entry in the IHT;
• storing compressed MISR single channel expect data for each scan chain of each single channel scanned from a passing IC;
• running a standard test, using channel MISR data, of the CUT, where for each scan cell of each scan chain of a selected single channel at least one compressed MISR single channel signature does not match the MISR single channel expect data and where translated bits of the at least one compressed MISR single channel signature do not match an entry in the IHT;
• and
• running a standard test, using the channel MISR data, of the CUT, where a selected data value is inserted into at least one location of a scan chain of the selected single channel for transmission to the MISR, resulting in a compressed MISR signature change that when translated matches an entry in the IHT, to provide the failure location of the latch in the CUT.

A method comprising:

• storing compressed multiple input shift register (MISR) expect data for each scan chain of each channel scanned from a passing integrated circuit (IC);
• storing a failure location for each scan cell of each scan chain of each channel translated from signature fail data from the MISR in an isolation hatch table (IHT);
• running a standard test, using circuit under test (CUT) MISR data, of the CUT to determine if the CUT fails;
• running channel diagnostics, using channel MISR data for every channel of the CUT to determine if at least one of the channels fails;
• and
• running aperture diagnostics, using the channel MISR data, for every failing channel of the CUT to determine a failure location of the latch in the CUT.