Testing head comprising vertical probes

A testing head for functionality testing an electronic device under test comprising:

• a plurality of vertical contact probes, and
• at least one couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes in order to slidably house the plurality of contact probes,
• each contact probe comprising:
• a rod-like body,
• a first end and a second end
• the rod-like body extending along a preset longitudinal axis between the first and second ends,
• the first end being a contact tip adapted to abut onto a contact pad of the electronic device under test and
• the second end being a contact head adapted to abut onto a contact pad of a space transformer,
• wherein at least one support of the supports comprises
• at least one couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes, and
• wherein each contact probe comprises:
• a lateral wall and at least one protruding element or stopper protruding from the lateral wall,
• the lateral wall contacting one wall of at least one of the guide holes of the guides.

A testing head for functionality testing an electronic device to be tested comprising:

• a plurality of vertical contact probes, and
• at least one couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes in order to slidably house the plurality of contact probes,
• each contact probe comprising:
• a rod-like body,
• a first end and a second end
• the rod-like body extending along a preset longitudinal axis between the first and second ends,
• the first end being a contact tip adapted to abut onto a contact pad of the device under test and
• the second end being a contact head adapted to abut onto a contact pad of a space transformer,
• wherein at least one of the supports comprises at least one couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes and
• wherein each contact probe comprises:
• a lateral wall and at least one protruding element or stopper protruding the lateral wall and being apt to abut onto an undercut wall of the guides under which it is positioned,
• the lateral wall being apt to contact one wall of at least one of the guide holes of the guides,
• the contact head having a diameter greater than a diameter of the guide holes of the guides and preventing the contact head from passing through the guide holes.

A method for assembling a testing head comprising:

• a plurality of vertical contact probes, and
• at least one couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes in order to slidably house the plurality of contact probes,
• at least one of the supports comprising at least one couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes and each contact probe comprising at least one protruding element or stopper originating from one of its lateral walls, the at least one couple of plate-like supports including an upper support and a lower support,
• the method comprising at least the steps of:
• overlapping the lower support and first and second guides of the upper support having respective guide holes concentric to each other;
• inserting the contact probes in the respective guide holes;
• a first relative movement of the upper support, the guides moving together, with respect to the lower support along a first direction, perpendicular to the supports, passing the stopper through the corresponding guide holes of the upper support;
• and
• a second relative movement of the upper support, the guides moving together, with respect to the lower support along a second direction, parallel to the supports.